Microscopy Laboratory [E]

Equipment

• JEOL JSM-IT100 scanning electron microscope: - an SEM (2015) with high vacuum (HV) and low vaccum (LV) operation modes, equipped with SED, BED, LV SED, and an optional CLD detector, as well as an EDS (energy-dispersive X-ray spectroscopy) detector for qualitative and quantitative elemental chemical analysis
• JEOL JSM-T330A scanning electron microscope with a digital image capture system using Orion software: - an older model (year 1989!), but extremely reliable conventional high-vacuum SEM
• Baltec SCD-50 sputter coater - applies a thin conductive (Au) coating to the sample that is effective in eliminating charging of non-conductive materials or enhancing secondary electron emission
• JEOL JEC-530 carbon coater - applies a thin conductive carbon film on a sample surface