Skip to main content

Laboratory for microscopy [E]

Electrone microscopy

Optical microscopy

Sample preparation

 

 

 

Equipment

  • JEOL JSM-IT100 scanning electron microscope: - a new SEM (2015) with high vacuum (HV) and low vaccum (LV) operation modes, equipped with SED, LV SED, BED and CLD detectors, as well as an EDS (energy-dispersive X-ray spectroscopy) detector for qualitative and quantitative elemental chemical analysis
  • JEOL JSM-T330A scanning electron microscope with digital image capture using Orion software: - an older model (year 1989!), but extremely reliable conventional high vaccum SEM
  • Baltec SCD-50 gold sputter coater - for depositing a thin film of conductive metal on samples for observation in high vacuum
  • JEOL JEC-530 carbon coater- for carbon coating deposition


JEOL JSM-IT100.

 


Baltec SCD-50 gold sputter coater.

 


JEOL JEC-530 carbon coater.

 

krm-k35_bes500krm-k35_eds_al500

krm-k35_eds_ca500krm-k35_eds_fe500


Bauxite ooid in a carbonate matrix; LV BEI image and maps of aluminum, calcium, and iron content. Captured with JSM-IT100.